Keysight IC-CAP 2020.2

IC-CAP (Integrated Circuit Characterization and Analysis Program) is the industry standard software for DC, analog and RF semiconductor device characterization and modeling.

IC-CAP extracts accurate compact models for use in high speed/digital, analog, power electronics and power RF applications. IC-CAP offers device engineers and designers a state of-the-art modeling tool that fills numerous modeling needs, including automated instrument control, data acquisition, parameter extraction, graphical analysis, simulation, optimization, and statistical analysis. All of these capabilities are combined in a flexible, automated and intuitive software environment for efficient and accurate extraction of active, passive and user-defined devices and circuits. Today’s most advanced semiconductor foundries and Integrated Device Manufacturers (IDMs) rely on IC-CAP for modeling silicon CMOS, Bipolar, compound gallium arsenide (GaAs), gallium nitride (GaN), and many other device technologies.
Features At a Glance
– Open software architecture enables you to achieve maximum accuracy by integrating your own modeling expertise and methodologies, and provides ultimate flexibility to create and automate measurement, extraction and verification procedures.
– Turnkey extraction solutions for industry standard CMOS models, such as BSIM3/BSIM4, PSP, HiSIM, and HiSIM_HV minimize the learning curve and maximize model accuracy.
– Unique nonlinear high-frequency modeling with Keysight DynaFET, NeuroFET, Root models, high frequency BJT, MESFET, PHEMT, and state-of-the-art Verilog-A models.

– Direct links to most commercial simulators (e.g., ADS, HSPICE, Spectre, and ELDO) ensure consistency between extracted models and the simulators used by circuit designers.
– The most advanced and complete on-wafer automated measurement and characterization environment with IC-CAP Wafer Professional (WaferPro).
– Powerful data handling capabilities.
– IC-CAP Power Electronics Model Generator enables the extraction of SiC, GaN and IGBT power devices and works in conjunction with Keysight PD1000A Measurement System for Advanced Modeling

Extracting Models with IC-CAP
A typical modeling procedure involves selecting a model based on the device technology and its final circuit application (e.g., DC, high frequency or both), making the necessary measurements to characterize a device or a set of devices, and then finally applying an extraction algorithm to calculate the model parameters. This last step is achieved by either calculating the parameters using built-in or custom model equations from measured data, or by tuning or optimization techniques.

IC-CAP provides the platform and tools engineers need to develop their own extraction methodologies. Turnkey modeling extraction packages for users who need to be up and running by day one are provided by both Keysight and third-party vendors.