Location:HOME > EDA.PCB.CAM > Introduction

EDA.PCB.CAM

Semiconductor Test System Development v21.0

NI SystemLink Semiconductor Test System Development Labview NI InstrumentStudio labview NI-VISA free download lavwindows NI DIAdem Laboratory Virtual Instrument Engineering Workbench

cadcamaec@protonmail.com2023-09-11EDA.PCB.CAM218

SemiconductorTestSystemDevelopmentSoftware21.0isaproduction-readyATEsolutionforRF,mixed

Semiconductor Test System Development Software 21.0 is a production-ready ATE solution for RF, mixed-signal, and MEMS semiconductor devices that helps improve time to market and lower the cost of test.

New Features - Date:
STS Software 21.0 adds the following major new features:

New Hardware Support
- PXIe-6569 — Added support for the PXIe-6569 high-speed serial instrument.
- PXIe-4137 (40 W) Source Measure Unit (SMU) — Added support for the high power (40W/10 A, pulsed) SMU version of the PXIe-4137.
- PXIe-4190 — Added support for the PXIe-4190 LCR. Support applies only to STS models with the CX configuration.

New and Improved Test Program Development and Debugging
- Added support for extended continuity test frequency range up to 21.5 GHz on the PXIe-5831 + PXIe-5841 with STS-5531 as an STS RF subsystem.
- RF Steps added the following new steps and examples:
. The WLAN Test - 8 GHz example sequence demonstrates how to perform error vector magnitude (EVM) measurements with noise compensation on the PXIe-5831 + PXIe-5841 with STS-5531 as an STS RF subsystem.
. The S-Parameter Test - 6 GHz example sequence demonstrates how to publish the S-parameter magnitude only or S-parameter magnitude and phase.
. The NR test example sequence demonstrates how to use the TSM RF Steps to implement NR TXP measurements.
- RF Steps adds the following new measurements:
. NR ACP measurements—Perform customized definition of measurement offset and integration bandwidth.
. WLAN OFDM ModAcc measurements—Support vector averaging type to reduce noise floor of a signal while retaining the signal spectrum.
. WLAN measurements—Support the IEEE 802.11be standard.
- The STS Auxiliary RF Tools provides the enhanced Golden Units Calibration Tool for calculating and updating the correlation offsets based on golden DUT, or known good unit, measurements. The enhanced features support multiple sites. You can calibrate golden units, retry failed golden units, check the calibration interval, and specify the minimum pass number of the golden units per site.
- The STS Auxiliary RF Tools provides the enhanced STS RF Switch Control Panel plug-in for InstrumentStudio, which allows you to configure and connect the RF subsystem internal switches and paths to perform RF measurements. The enhanced features expand support on the PXIe-5831 + PXIe-5841 with STS-5531 as an STS RF subsystem, extend the measurement frequency up to 21.5 GHz, and support the PXIe-5841 with STS-5534 as an STS RF subsystem.

The NI Semiconductor Test System (STS) is a production ready ATE solution that can lower the cost of test and accelerate your time to market for increasingly analog semiconductor devices. Ranging from wafer test to packaged part test, this small-footprint tester enables multi-site testing with a high parallel test efficiency (PTE) and provides an innovative interactive debug experience. With several decades of experience developing software, the test program development is graphical, user-friendly, and is intuitive to work with. Built on lab-grade equipment, STS also enables yield optimization and increased quality.